12E1. - UV-VIS Ellipsometer, 193 nm- 1.7µm, (0.7- 6.5 eV), Variable angle of incidence
Focusing probes Can measure transmission ellipsometry as well as reflection ellipsometry
12E2. IR Ellipsometer, 33µm- 1.7µm, 38 meV- 0.7 eV, 300- 6000 cm-1 Can measure transmission ellipsometry as well as reflection ellipsometry
15E1. - VIS Ellipsometer (Sentech SE801), Range: 240nm – 930nm, Depolarization, Multiple Angles ISAS –Labellipsometer, Contact: C. Cobet.
15E2. - IR - Ellipsometer at Bruker Vertex 70, 400 – 4000 cm-1, multiple angle, ISAS –Labellipsometer, Contact: K. Hinrichs.
15E3. - UV-VUV-Ellipsometer, PSA-Ellipsometer, 2.5-30eV, 40-490nm, resolution 5000, fixed angle of incidence (68/45°), focus 1x1mm, max. sample size 1x1cm, 10K<T<500K, synchrotron light source (BESSY II of the HZB-Berlin), Limited access via BESSY beam time proposals and prior approval by the station manager (Dr. C. Cobet, Leibniz-Institut für Analytische Wissenschaften).
15E4. - IR synchrotron mapping Ellipsometer, Rotating Compensator, 800 cm-1 – 3000 cm-1, focus < 1x1 mm2, Synchrotron light source (BESSY II of the HZB-Berlin), Limited access via BESSY beam time proposals and prior approval by the station manager (K. Hinrichs Leibniz-Institut für Analytische Wissenschaften).