INT Print

1. Laboratory:  INT

The Institute for Nanotechnology
University of Karlsruhe
Hermann-von-Helmholtz-Platz 1
76344 Eggenstein-Leopoldshafen
Deutschland

http://www.int.kit.edu/english/21_martin.wegener.php?PHPSESSID=29188204562a135269dde20245b91a8c


2. Contact point:

Name: Prof. Martin Wegener

Position: University Professor

Email:martin.wegener"you know what"kit.edu

Tel.: +49 (0)721 608-3400

Fax.: +49 (0)721 608-8480

3. Access rules:

Facilities availability for external users:

We are always open for new scientific collaborations.
For single measurements, we have also previously provided access to our facilities for external users who have just thanked us in the acknowledgements of a paper.

Expenses reimbursement type:

Non-profit use only.

Rules on cooperation:

No special rules.

 

 4. Equipment

Interferometers:

 

Spectrometers:

9S1. - Fourier-Transform microscope-spectrometer,Wavelength range 0.4 µm to 5 µm, reflection and transmission, various polarisation optics, angle dependent measurements possible
9S2. - Fourier-Transform microscope-spectrometer,Wavelength range 1 µm to 12 µm, reflection and transmission, various polarisation optics, angle dependent measurements possible
             
Microscopes

9M1. - Atomic-force microscope
9M2. - Aperture near-field scanning optical microscope

Radiation sources      

9R1. - Various laser systems including “white-light” lasers and femtosecond lasers and optical parametric oscillators and optical parametric amplifiers

Other

9O1. - Various sensitive camera systems.

 

6. Expertise

Interferometry

- Using the above light sources, dedicated interferometers can be (and have been) built for measuring phase delays from metamaterial samples.

Spectrometry

- With the above mentioned setups, samples as small as a few tens of micrometers in diameter can routinely be characterized in transmission, reflection and for various angles of incidence.

Microscopy

Yes


Table: Expertise by material type and sample geometry combinations:

Materials types
Slabs
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate

Sub-wave
length
samples

 

Thin films

Isotropic materials
  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS Optical, AS Optical, AS
Photonic crystals Optical, AS  Optical, AS  Optical, AS  Optical, AS Optical, AS Optical, AS Optical, AS
Quasicrystals
 Optical, AS  Optical, AS  Optical, AS  Optical, AS Optical, AS  Optical, AS  Optical, AS
Mesoscopic samples  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS
Bianisotropic  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS Optical, AS Optical, AS
Anisotropic
inversion symmetrical
Optical, AS Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS Optical, AS
Active materials  Optical, T  Optical, T  Optical, T  Optical, T  Optical, T  Optical, T  Optical, T
Controllable materials  Optical, T  Optical, T  Optical, T  Optical, T  Optical, T  Optical, T  Optical, T
Diffraction gratings  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS  Optical, AS
Scattering media              
Other              

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient  or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material