1. Laboratory: NIMNIL_IF

Center for Solid State Physics and New Materials

http://www.solid.ipb.ac.rs/

2. Contact point:

Name: Rados Gajic

Position: Research Professor

Email: RGAJIC@IPB.AC.RS

Tel.: +381 11 3713 046

Fax.:+381 11 362 190
 

3. Access rules:

Facilities availability for external users: 

- Yes, in principle

Expenses reimbursement type:

  - No special rules.

 Rules on cooperation:

- No special rules.

4. Equipment

Interferometers:

11I1. - Bomem DA8, Fourier transform spectrometer, 30-25000 cm-1, microscope, Cryostat, 0.03 cm-1, right now needs a service.

Elipsometers:

11E1. - SOPRA GES5, MID IR to Optical, Cryostat 4K

Spectrometers:

11S1. Micro Raman Jobin Yvon T64000, Cryostat, confocal Raman, resolution 1 cm-1.

Microscopes

11M1. - Omicron VT AFM/STM, Ultra high vacuum, Cryostat 20K, atomic resolution
11M2. - TwinSNOM –scannining near field, SNOM, shear force AFM, Needle sensor AFM
11M3. - NTEGRA AFM, AFM, STM, MFM, SSRM, SCM, EFM, lithography, atomic resolution
- two Zeiss microscopes    
 

Radiation sources:

11R1. - Globar, quartz, xenon lamp, Hg lamp

Other:

11O1. - DTGS, MCT, PMT, InSB,…

6. Expertise

Interferometry

Yes

Ellipsometry

Yes

Spectrometry

Yes

Microscopy

 Yes

Table: Expertise by material type and sample geometry combinations:

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material