We are always open for new scientific collaborations.
For single measurements, we have also previously provided access to our facilities for external users who have just thanked us in the acknowledgements of a paper.
Expenses reimbursement type:
Non-profit use only.
Rules on cooperation:
No special rules.
4. Equipment
Interferometers:
Spectrometers:
9S1. - Fourier-Transform microscope-spectrometer,Wavelength range 0.4 µm to 5 µm, reflection and transmission, various polarisation optics, angle dependent measurements possible 9S2. - Fourier-Transform microscope-spectrometer,Wavelength range 1 µm to 12 µm, reflection and transmission, various polarisation optics, angle dependent measurements possible Microscopes
9R1. - Various laser systems including “white-light” lasers and femtosecond lasers and optical parametric oscillators and optical parametric amplifiers
Other
9O1. - Various sensitive camera systems.
6. Expertise
Interferometry
- Using the above light sources, dedicated interferometers can be (and have been) built for measuring phase delays from metamaterial samples.
Spectrometry
-
With the above mentioned setups, samples as small as a few tens of micrometers in diameter can routinely be characterized in transmission, reflection and for various angles of incidence.
Microscopy
Yes
Table: Expertise by material type and sample geometry combinations:
Materials types
Slabs
Complex shape object
Bulk samples or bars
Substrate
layer(s) on substrate
Sub-wave
length
samples
Thin films
Isotropic materials
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Photonic crystals
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Quasicrystals
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Mesoscopic samples
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Bianisotropic
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Anisotropic
inversion symmetrical
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Active materials
Optical, T
Optical, T
Optical, T
Optical, T
Optical, T
Optical, T
Optical, T
Controllable materials
Optical, T
Optical, T
Optical, T
Optical, T
Optical, T
Optical, T
Optical, T
Diffraction gratings
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Optical, AS
Scattering media
Other
Notation used here:
Frequency range: MHz, GHz, THz or optical R - reflection coefficient amplitude or intensity; T - transmission coefficient or intensity, P - phase information; A - reflection and transmission on many angles of incidence; E - ellipsometry data; D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization); S - internal structure investigation with microscopy (nanoscopy); Ch - chemical properties investigation (metal or dielectric etc.); Chi(2)/Chi(3) of the material