1. Laboratory: ORC
Optoelectronics Research Centre
University of Southampton
Highfield, Southampton
Hampshire. SO17 1BJ
UK
http://www.orc.soton.ac.uk/people.html
2. Contact point:
Name: Prof. Nikolay Zheludev
Position: Deputy Director ORC (Physics)
Email: niz"you know what"orc.soton.ac.uk
Tel.: +44 (0) 2380 593566
Fax.: +44 (0) 2380 593142
3. Access rules:
Facilities availability for external users:
Yes, in principle
Expenses reimbursement type:
No information
Rules on cooperation:
No special rules.
4. Equipment
Spectrometers:
10S1. - UV-to-NIR, Microspectrophotometer/ range: 250 – 2200 nm/ minimal sampling area 2x2 m/ linear transmission, and reflection, pump-probe/ linear and circular polarizations
10S2. - FTIR, Microspectrometer/ range: 1.5 – 30 m/ minimal sampling area: 20x20m/ linear transmission and reflection/ linear polarizations
10S3. - THz-TDS, Frequency range 0.2 – 3 THz/ spectral resolution 15 GHz/ linear polarization/ imaging capability
10S4. -Laser spectrometer, Based on supercontinuum quasi-cw laser/ range 450 – 2200 nm/ minimal focal spot 20 m/ linear transmission and reflection, z-scan, pump-probe/ linear and circular polarizations
Microscopes
10M1. - Scanning near field microscope, Resolution < 100 ïm/ wavelength range 400 – 900 nm/ transmission, reflection and collection mode
10M2. - Scanning electron microscope, Energy range 5 – 50 kV/ resolution 10-20 nm
Radiation sources
10R1. - Supercontinuum laser, Photonic crystal fibre-based/ quasi-cw power up to 3W/ spectral range 450 – 2200 nm
10R2. - Optical parametric oscillator, Wavelength tuning range 400 – 2400 nm/ pulse duration 8 ns/ repetition rate 1 – 20 Hz/ pulse energy few mJ
10R3. - F.A.S.T., Comprehensive and flexible commercial ultrafast laser
system/ pulse durations 130 - 200 fs/ repetition rates from a single-shot to 300kHz/ wavelength tuning range 235 -nm to 10 m/ pulse energies from nJ to mJ
6. Expertise
Spectrometry
Yes
Microscopy
Yes
Table: Expertise by material type and sample geometry combinations:
Materials types
|
Slabs
|
Complex shape object |
Bulk samples or bars
|
Substrate |
layer(s) on substrate
|
Sub-wave
length
samples
|
Thin films
|
Isotropic materials
|
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Photonic crystals |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Quasicrystals
|
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Mesoscopic samples |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Bianisotropic |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Anisotropic
inversion symmetrical |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Active materials |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Controllable materials |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
GHz, THz, optical, R, T, P, A |
optical, R, T |
GHz, THz, optical, R, T, P, A |
Diffraction gratings |
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Scattering media |
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Other |
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Notation used here:
Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material
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