ORC Print E-mail

1. Laboratory: ORC

Optoelectronics Research Centre
University of Southampton
Highfield, Southampton
Hampshire. SO17 1BJ
UK

http://www.orc.soton.ac.uk/people.html


2. Contact point:
Name: Prof. Nikolay Zheludev

Position: Deputy Director ORC (Physics)

Email: niz"you know what"orc.soton.ac.uk

Tel.: +44 (0) 2380 593566

Fax.: +44 (0) 2380 593142

 

3. Access rules:

Facilities availability for external users: 

 Yes, in principle

 

Expenses reimbursement type:

No information

Rules on cooperation:

 No special rules.

 

4. Equipment

Spectrometers:

10S1. - UV-to-NIR, Microspectrophotometer/ range: 250 – 2200 nm/ minimal sampling area 2x2 m/ linear transmission, and reflection, pump-probe/ linear and circular polarizations
10S2. - FTIR, Microspectrometer/ range: 1.5 – 30 m/ minimal sampling area: 20x20m/ linear transmission and reflection/ linear polarizations
10S3. - THz-TDS, Frequency range 0.2 – 3 THz/ spectral resolution 15 GHz/ linear polarization/ imaging capability
10S4. -Laser spectrometer, Based on supercontinuum quasi-cw laser/ range 450 – 2200 nm/ minimal focal spot 20 m/ linear transmission and reflection, z-scan, pump-probe/ linear and circular polarizations

Microscopes

10M1. - Scanning near field microscope, Resolution < 100 m/ wavelength range 400 – 900 nm/ transmission, reflection and collection mode
10M2. - Scanning electron microscope, Energy range 5 – 50 kV/ resolution 10-20 nm

Radiation sources

10R1. - Supercontinuum laser, Photonic crystal fibre-based/ quasi-cw power up to 3W/ spectral range 450 – 2200 nm
10R2. - Optical parametric oscillator, Wavelength tuning range 400 – 2400 nm/ pulse duration 8 ns/ repetition rate 1 – 20 Hz/ pulse energy few mJ
10R3. - F.A.S.T., Comprehensive and flexible commercial ultrafast laser
system/ pulse durations 130 - 200 fs/ repetition rates from a single-shot to 300kHz/ wavelength tuning range 235 -nm to 10 m/ pulse energies from nJ to mJ

6. Expertise

Spectrometry

  Yes


Microscopy
Yes

 

Table: Expertise by material type and sample geometry combinations:

Materials types
Slabs
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate

Sub-wave
length
samples

 

Thin films

Isotropic materials
GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Photonic crystals GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Quasicrystals
GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Mesoscopic samples GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Bianisotropic GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Anisotropic
inversion symmetrical
GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Active materials GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Controllable materials GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A GHz, THz, optical, R, T, P, A optical, R, T GHz, THz, optical, R, T, P, A
Diffraction gratings              
Scattering media              
Other              

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material