JENA Print E-mail

1. Laboratory:  JENA

Friedrich Schiller University Jena
Center for Innovation Competence
Institute of Applied Physics
Max-Wien-Platz 1
07737 Jena

http://www.jsmc.uni-jena.de/cms/index.php?option=com_content&task=view&id=315&Itemid=221


2. Contact point:

Name: Prof. Dr. Thomas Pertsch
Position: Head of Nano-Optics
Email: thomas.pertsch"you know what" uni-jena.de
Tel.: +49 (0)3641 9 47 840
Fax.: +49 (0)3641 9 47 841

3. Access rules:

Facilities availability for external users:

Access is permitted if there is a common scientific interest in the investigated subject.

Expenses reimbursement type:

Cost can be shared if there is a common scientific interest in the investigated subject. 

Rules on cooperation:

Please get in contact with us (see contact address above) in case of a specific request.

 

 4. Equipment

Interferometers:

8I1. - Zygo Plane Wave Interferometer, 12” sample diameter
8I2. - MicroMap Interference Optical Surface Profiler, (Mirau-Type)    
8I3. - Custom white light interferometer for phase resolved transmission and reflection coefficient measurement, optical (VIS-NIR), sample size in the range of mm2
 

Spectrometers:

8S1. - Lambda 19   
8S2.- Lambda 950

             
Microscopes

8M1. - Hitatchi 8100 SEM, up to 8” sample diameter
8M2. - Zeiss Dual Beam SEM/FIB, up to 9” sample size
8M3. - Different optical Microscopes, up to 12” sample size
8M4. - Large Range AFM, up to 12” sample size

Radiation sources      

8R1. - Different laser sources, 405nm … 1.55µm
8R2.- Different LEDs, VIS
8R3. - Tunable fs- and ps- lasers, NIR
8R4. - Tunable diode lasers, NIR
8R5. - Cw-lasers, VIS-NIR (TiSa)

Other

8O1.- SNOM, fiber tip SNOM

 

6. Expertise

Interferometry

Characterization of homogeneity of periodic structures.

Spectrometry

Characterization of reflection and transmission spectra of samples in the VIS/NIR spectral region, with phase measurement.

Microscopy

Geometry characterization of optical micro- and nano-structures by optical microscopy, SNOM, SEM, and AFM. 

Other

Table: Expertise by material type and sample geometry combinations:

Materials types
Slabs
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate

Sub-wave
length
samples

 

Thin films

Isotropic materials
optical, R,T,P,A
       optical, R,T,P,A    
Photonic crystals  optical, R,T,P,A        optical, R,T,P,A    
Quasicrystals
 optical, R,T,P,A        optical, R,T,P,A    
Mesoscopic samples    optical, R,T          optical, R,T    
Bianisotropic  optical, R,T,P         optical, R,T,P    
Anisotropic
inversion symmetrical
 optical, R,T,P         optical, R,T,P    
Active materials              
Controllable materials              
Diffraction gratings              
Scattering media              
Other              

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient  or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material