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1. Laboratory: NBTG
Nanobiotechnology-Group
Prof. Dr. C. Sönnichsen
Institute for Physical Chemistry
Jakob Welder Weg 11
D-55128 Mainz, Germany
http://www.carsten-soennichsen.de/75_DEU_HTML.php
2. Contact point:
Name: Dr. Carsten Sönnichsen
Position: Professor
Email: Soennichsen"you know what"uni-mainz.de
Tel.: +49 (0) 6131 39 24313
Fax.: +49 (0) 6131 39 26747
3. Access rules:
Facilities availability for external users:
Yes, in principle;
Expenses reimbursement type:
Non-for-profit use for national institutions or other bodies;
and commercial use for any external customer;
Rules on cooperation:
http://www.nano-bio-tech.de
4. Equipment
Spectrometers:
5S1. - Absorption Spectroscopy, Wavelength range: 250 – 1000 nm
5S2.- Fluorescence Spectroscopy, Wavelength range 250 – 1000 nm
5S3. - Scattering Spectroscopy, Wavelength range: 450 – 850 nm
Microscopes
5M1.- Transmission Electron Microscopy, Resolution: 0.5 nm
5M2.- Darkfield Microscope, Resolution: 1 m
5M3. - Fluorescence Mircoscope, Resolution: 1m
5M4. - Scanning Electron Microscope, Resolution: 100 nm
Radiation sources
5R1.- Wide band light source (Halogen), Output Power: 0.1 W
5R2.- Wide band light source (LASER), Output Power: 3 W (Range: 400 – 2000 nm)
5R3. - LASER, 450 nm; Output Power: 39 mW
5R4. - LASER, 633 nm; Output Power: 10 mW
6. Expertise
Spectrometry
- Literature:“Spectroscopy of single metallic nanoparticles using total internal reflection microscopy”, Applied Physics Letters, Year: 2000, Vol: 77, Pages: 2949 – 2951
Microscopy
- Literature: “Gold nanoparticle growth monitored in situ using a novel fast optical single-particle spectroscopy method”, Nano Leters, Year: 2007, Vol: 7, Pages: 1664-1669
Table: Expertise by material type and sample geometry combinations:
Materials types
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Slabs
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Complex shape object |
Bulk samples or bars
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Substrate |
layer(s) on substrate
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Sub-wave
length
samples
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Thin films
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Isotropic materials
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R, optical |
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| Photonic crystals |
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R, optical |
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Quasicrystals
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R, optical |
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| Mesoscopic samples |
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| Bianisotropic |
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R, optical |
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Anisotropic
inversion symmetrical |
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R, optical |
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| Active materials |
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R, optical |
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| Controllable materials |
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R, optical |
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| Diffraction gratings |
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| Scattering media |
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| Other |
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Notation used here:
Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material
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