Table: Expertise by material type and sample geometry combinations:
Materials types
Slabs
Complex shape object
Bulk samples or bars
Substrate
layer(s) on substrate
Sub-wave
length
samples
Thin films
Isotropic materials
Optical, S
Optical, S
Optical, S
Optical, S
Optical, S
Photonic crystals
Optical, S
Optical, S
Optical, S
Optical, S
Optical, S
Quasicrystals
Mesoscopic samples
Bianisotropic
Anisotropic
inversion symmetrical
Active materials
Controllable materials
Diffraction gratings
Scattering media
Other
Notation used here:
Frequency range: MHz, GHz, THz or optical R - reflection coefficient amplitude or intensity; T - transmission coefficient or intensity, P - phase information; A - reflection and transmission on many angles of incidence; E - ellipsometry data; D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization); S - internal structure investigation with microscopy (nanoscopy); Ch - chemical properties investigation (metal or dielectric etc.); Chi(2)/Chi(3) of the material