Recommendations on “How to choose the appropriate measurement technique for EM NSM characterization and the parameters’ evaluation” Print E-mail

Most techniques employed for evaluation of the electromagnetic parameters of metamaterials are based upon the transmission, reflection and refraction measurements. The type of the structure analysed determines the specific experimental arrangements. The instruments used for optical measurements involve spectrometers and ellipsometers, whereas the initial material identification requires the structural analysis and microscopy. The main types of spectrometers, ellipsometers and interferometers are briefly outlined accompanied by the description of their operational principles. Application of these apparatus to the experimental characterisation of the specific types of metamaterials is outlined. The main approaches to the experimental characterization of metamaterials at optical wavelengths and in THz ranges are summarised here.