Non-for-profit use for national institutions or other bodies
Rules on cooperation:
No special rules
4. Equipment
Interferometers:
14I1. - White-light spectral interferometry, Phase: transmission, reflection (3eV-0.729eV)
Accuracy: 0.02 rad, The size of the sample have to be larger when 2x2mm. Reference fields on the substrate (a pure substrate, a mirror) are required.
Spectrometers:
14S1. -
PerkinElmer Lambda950, 3eV-0.496eV, transmission under 00, reflection under 80
Radiation sources:
14R1.
- Supercontinuum Whigt source, 3eV-0.729eV, 1.6 W
6. Expertise
Interferometry
Yes
Spectrometry
Yes
Table: Expertise by material type and sample geometry combinations:
Materials types
Slabs
Complex shape object
Bulk samples or bars
Substrate
layer(s) on substrate
Sub-wave
length
samples
Thin films
Isotropic materials
T, R, P
(3eV-0.729eV)
T, R, P
(3eV-0.729eV)
Photonic crystals
Quasicrystals
Mesoscopic samples
Bianisotropic
Anisotropic
inversion symmetrical
Active materials
Controllable materials
Diffraction gratings
Scattering media
Other
Notation used here:
Frequency range: MHz, GHz, THz or optical R - reflection coefficient amplitude or intensity; T - transmission coefficient or intensity, P - phase information; A - reflection and transmission on many angles of incidence; E - ellipsometry data; D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization); S - internal structure investigation with microscopy (nanoscopy); Ch - chemical properties investigation (metal or dielectric etc.); Chi(2)/Chi(3) of the material