NIMNIL_JENA Print

1. Laboratory: NIMNIL_JENA

Institute of Applied Physics
Friedrich-Schiller-Universität Jena
Max-Wien-Platz 1
07743 Jena
Germany

www.iap.uni-jena.de


2. Contact point:

Name: Ekaterina Pshenay-Severin

Position: PhD student

Email: katja.severin@uni-jena.de

Tel.: +493641947844


 

 

3. Access rules:

Facilities availability for external users: 

 Yes, in principle

 

Expenses reimbursement type:

  Non-for-profit use for national institutions or other bodies

Rules on cooperation:

No special rules

 

4. Equipment

Interferometers:

14I1. - White-light spectral interferometry, Phase: transmission, reflection (3eV-0.729eV)
Accuracy: 0.02 rad, The size of the sample have to be larger when 2x2mm. Reference fields on the substrate (a pure substrate, a mirror) are required.

Spectrometers:

14S1. - PerkinElmer Lambda950, 3eV-0.496eV, transmission under 00, reflection under 80


Radiation sources:

14R1.  - Supercontinuum Whigt source, 3eV-0.729eV, 1.6 W

 

6. Expertise

Interferometry

Yes

Spectrometry

Yes

 

Table: Expertise by material type and sample geometry combinations:

Materials types
Slabs
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate

Sub-wave
length
samples

 

Thin films

Isotropic materials
       

T, R, P

(3eV-0.729eV)

 

T, R, P

(3eV-0.729eV) 
   
Photonic crystals              
Quasicrystals
             
Mesoscopic samples              
Bianisotropic              
Anisotropic
inversion symmetrical
             
Active materials              
Controllable materials              
Diffraction gratings              
Scattering media              
Other              

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material