|
1. Laboratory: NIMNIL_SEN
Sentech Instruments GmbH
Carl Scheele Straße 11
12489 Berlin
Germany
http://www.sentech.de/
2. Contact point:
Name: Lars Reißmann
Position: physicist, application
Email: lars.reissmann@sentech.de
Tel.: ++49 30 6392 5506
Fax.: ++49 30 6392 5522
3. Access rules:
Facilities availability for external users:
Access to our demo-lab is restricted, but sample evaluation done by us is possible.
Expenses reimbursement type:
Commercial use for any external customer is possible.
Rules on cooperation:
Every case is handled separately.
4. Equipment
Elipsometers:
13E1. - SENpro, Spectroscopic ellipsometer VIS, 370 – 1050 nm, multiple angle.
13E2. - SENresearch, Spectroscopic ellipsometer UV-VIS-NIR,190 – 2500 nm, multiple angle, FT-IR ellipsometry
13E3. - SENDIRA, FT-IR ellipsometer for MIR, 1700– 25000nm, multiple angle, Horizontal system stage, FT-IR ellipsometry
Radiation sources:
13R1. - Globar, quartz, xenon lamp, Hg lamp
Other:
13O1. - SENhaze, Unit for measuring Transmittance, Reflectance, HazeT and HazeR, Spectral range: 300 – 980 nm, detection by integrating-sphere, For T and R: directional, diffuse, total values, Reflection: fixed angle of incidence: 8.
13O2. - RM1000, VIS-NIR, reflectometer, 430 – 930 nm.
13O3. - RM2000, UV-VIS-NIR, reflectometer, 200 – 980 nm.
6. Expertise
Ellipsometry
Yes
Table: Expertise by material type and sample geometry combinations:
Materials types
|
Slabs
|
Complex shape object |
Bulk samples or bars
|
Substrate |
layer(s) on substrate
|
Sub-wave
length
samples
|
Thin films
|
Isotropic materials
|
|
|
E, T, R |
E, T, R |
E, T, R |
|
|
| Photonic crystals |
|
|
|
|
E |
|
|
Quasicrystals
|
|
|
|
|
|
|
|
| Mesoscopic samples |
|
|
|
|
E |
|
|
| Bianisotropic |
|
|
E |
E |
E |
|
|
Anisotropic
inversion symmetrical |
|
|
|
|
|
|
|
| Active materials |
|
|
|
|
|
|
|
| Controllable materials |
|
|
|
|
|
|
|
| Diffraction gratings |
|
|
|
E |
E |
|
|
| Scattering media |
|
|
|
E |
E |
|
|
| Other |
|
|
|
|
|
|
|
Notation used here:
Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material
�
�
|
