TUI Print

1. Laboratory:  TUI

Technical University of Ilmenau
Faculty of Mathematics and Science
Institut of Physics
Experimental Physics II

PO.Box: 100565
98684 Ilmenau
Germany

http://tu-ilmenau.de/fakmn/index.php?id=975


2. Contact point:

Name: Thomas Klar

Position: Pof.

Email: thomas.klar"you know what"tu-ilmenau.de

Tel.: +49 +3677 69 3670
Fax: +49 +3677 69 3770
 

3. Access rules:

No promotion outside the scientific community.

Facilities availability for external users:

Yes, in principle, but no promotion outside the scientific community  

Expenses reimbursement type:

Scientific collaborations, but no promotion outside the scientific community.

Rules on cooperation:

To be defined in each special case, but no promotion outside the scientific community.

 

 4. Equipment

Spectrometers:

4S1. - Dark filed scattering spectroscopy in the visible range can be combined with Raman / fluorescence spectroscopy          

 

6. Expertise

Spectrometry

- Dark field scattering spectroscopy of metallic nanostructures, single nanoparticle spectroscopy, spectroscopy of hybrid nanomaterials comprising metallic nanostructures, organic fluorescent molecules, colloidal quantum dots etc.

- Combined Mie scattering spectroscopy and fluorescence  / Raman spectroscopy.

- All techniques in the visible range.

 
Microscopy

- Fluorescence microscopy beyond the Abbe limit (STED: Stimulated emission depletion) Microscopy. Yields some 10 nm of 3D resolution but needs fluorescing species.


Table: Expertise by material type and sample geometry combinations:

Materials types
Slabs
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate

Sub-wave
length
samples

 

Thin films

Isotropic materials
             
Photonic crystals              
Quasicrystals
             
Mesoscopic samples              
Bianisotropic              
Anisotropic
inversion symmetrical
             
Active materials            optical range,
combined Mie scattering, Raman and/or fluorescence

 
 
Controllable materials              
Diffraction gratings              
Scattering media              
Single nanoparticle / nanodevice          

optical range

R, T, P
 

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient  or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material