LPC Print

1. Laboratory:  LPC
ETH Zurich
Laboratory of Physical Chemistry
HCI, F 205
CH-8093 Zurich
Switzerland

http://www.nano-optics.ethz.ch/people/vahid/index


2. Contact point:
Name:Vahid Sandoghdar
Position: Prof.
Email: vahid.sandoghdar
"you know what" ethz.ch
Tel.: +41 44 633 4621
Fax.: +41 44 633 1316


3. Access rules:

Facilities availability for external users:

Yes, in principle

Expenses reimbursement type:

No information

Rules on cooperation:

No information.

 

 4. Equipment

Interferometers:

2I1. - Fabry-Perot,    FSR: 150 MHZ-10 GHz (visible and near-infrared)

Spectrometers:

2S1. -Grating spectrometer, Range: 300-1000nm, Resolution: 0.1 nm, sensitivity: EM CCD (single molecule sensitve)
               
Microscopes        

2M1.- AFM
2M2.- Scanning near-field optical microscope, visible
2M3.- Laser scanning microscope, Room and low temperature (1.4K)
2M4.- Widefield microscope,  Room and low temperature (1.4K)

        
Radiation sources      

2R1.- Tunable dye laser (cw and ps-ns)
2R2. - Tunable Ti:sapphire laser (CW, ps, fs)
2R3. - Tunable diode laser

 

6. Expertise

Table: Expertise by material type and sample geometry combinations:

Materials types
Slabs
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate

Sub-wave
length
samples

 

Thin films

Isotropic materials
 Optical, S    Optical, S  Optical, S Optical, S  
 Optical, S
Photonic crystals  Optical, S    Optical, S  Optical, S Optical, S    Optical, S
Quasicrystals
             
Mesoscopic samples              
Bianisotropic              
Anisotropic
inversion symmetrical
             
Active materials              
Controllable materials              
Diffraction gratings              
Scattering media              
Other              

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient  or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material