NIMNIL_SEN Print E-mail

1. Laboratory: NIMNIL_SEN

Sentech Instruments GmbH

Carl Scheele Straße 11
12489 Berlin

2. Contact point:

Name: Lars Reißmann

Position: physicist, application


Tel.: ++49 30 6392 5506

Fax.: ++49 30 6392 5522 


3. Access rules:

Facilities availability for external users:

Access to our demo-lab is restricted, but sample evaluation done by us is possible.


Expenses reimbursement type:

Commercial use for any external customer is possible.


Rules on cooperation:

  Every case is handled separately.

4. Equipment


13E1. - SENpro, Spectroscopic ellipsometer VIS,   370 – 1050 nm, multiple angle.
13E2. - SENresearch, Spectroscopic ellipsometer UV-VIS-NIR,190 – 2500 nm, multiple  angle, FT-IR ellipsometry
13E3. - SENDIRA, FT-IR ellipsometer for MIR, 1700– 25000nm, multiple angle, Horizontal system stage, FT-IR ellipsometry

Radiation sources:

13R1. - Globar, quartz, xenon lamp, Hg lamp


13O1. - SENhaze, Unit for measuring Transmittance, Reflectance, HazeT and HazeR, Spectral range: 300 – 980 nm, detection by integrating-sphere, For T and R: directional, diffuse, total values, Reflection: fixed angle of incidence: 8.
13O2. - RM1000, VIS-NIR, reflectometer, 430 – 930 nm.
13O3. - RM2000, UV-VIS-NIR, reflectometer, 200 – 980 nm.

6. Expertise




Table: Expertise by material type and sample geometry combinations:

Materials types
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate




Thin films

Isotropic materials
    E, T, R E, T, R E, T, R    
Photonic crystals         E    
Mesoscopic samples         E    
Bianisotropic     E E E    
inversion symmetrical
Active materials              
Controllable materials              
Diffraction gratings       E E    
Scattering media       E E    

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material