1. Laboratory: NIMNIL_JKU

 Center for Surface and Nanoanalytics

Johannes Kepler University
Altenbergerstr. 69
4040 Linz

www.jku.at
www.zona.jku.at

2. Contact point:

Name: Dr. Kurt Hingerl

Position: Full Professor, Material Science, Center for Surface and Nano-analytics.

Email: kurt.hingerl@jku.at

Tel.: +43 732 2468 9662

Fax.: +43 732 2468 9696
 

3. Access rules:

Facilities availability for external users: 

We are looking for external interested parties and will be happy to cooperate, if measurements are done by the external interested parties (in case of ellipsomeetry and Raman)

 Expenses reimbursement type:

1)     Either scientific co-operation

2)     or clear charging of hours (according to ZONA Benutzerordnung)

Rules on cooperation:

www.zona.jku.at  

4. Equipment

Elipsometers

12E1. -  UV-VIS Ellipsometer, 193 nm- 1.7µm, (0.7- 6.5 eV), Variable angle of incidence
Focusing probes    Can measure transmission ellipsometry as well as reflection ellipsometry
12E2. IR Ellipsometer, 33µm- 1.7µm, 38 meV- 0.7 eV, 300- 6000 cm-1    Can measure transmission ellipsometry as well as reflection ellipsometry
 

Spectrometers:

12S1. - Confocal Raman Spectrometer for Graphene , Cooled Si detector Cooled InGas detector
For Raman as well as PL or fluorescence (down to 1.7 µm)    3 excitation lasers:
532 nm, 632 nm and 785 nm

Microscopes

12M1. - Transmission electron microscope. With EDX, dark field, bright field    Other details on request.
    
12M1. - Focused ion beam REM, Similar system as in the link, with EBSD, 2 electron detectors, EDX, etc.    Other details on request.
 

6. Expertise

Ellipsometry

Yes.

Extremely high expertise; also for anisotropic samples, etc.

Also for normal incidence: Reflection anisotropy spectroscopy

Also for simulations of structured samples, etc-.

Spectrometry

Yes. Raman spectroscopy

Microscopy

 Yes for electron microscopy

Table: Expertise by material type and sample geometry combinations:

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material