Name: Prof. Dr. Thomas Pertsch
Position: Head of Nano-Optics
Email: thomas.pertsch"you know what" uni-jena.de
Tel.: +49 (0)3641 9 47 840
Fax.: +49 (0)3641 9 47 841
3. Access rules:
Facilities availability for external users:
Access is permitted if there is a common scientific interest in the investigated subject.
Expenses reimbursement type:
Cost can be shared if there is a common scientific interest in the investigated subject.
Rules on cooperation:
Please get in contact with us (see contact address above) in case of a specific request.
4. Equipment
Interferometers:
8I1. - Zygo Plane Wave Interferometer, 12” sample diameter
8I2. - MicroMap Interference Optical Surface Profiler, (Mirau-Type)
8I3. - Custom white light interferometer for phase resolved transmission and reflection coefficient measurement, optical (VIS-NIR), sample size in the range of mm2
Spectrometers:
8S1. - Lambda 19 8S2.- Lambda 950
Microscopes
8M1. - Hitatchi 8100 SEM, up to 8” sample diameter
8M2. - Zeiss Dual Beam SEM/FIB, up to 9” sample size
8M3. - Different optical Microscopes, up to 12” sample size
8M4. - Large Range AFM, up to 12” sample size
Radiation sources
8R1. - Different laser sources, 405nm … 1.55µm
8R2.- Different LEDs, VIS
8R3. - Tunable fs- and ps- lasers, NIR
8R4. - Tunable diode lasers, NIR
8R5. - Cw-lasers, VIS-NIR (TiSa)
Other
8O1.- SNOM, fiber tip SNOM
6. Expertise
Interferometry
Characterization of homogeneity of periodic structures.
Spectrometry
Characterization of reflection and transmission spectra of samples in the VIS/NIR spectral region, with phase measurement.
Microscopy
Geometry characterization of optical micro- and nano-structures by optical microscopy, SNOM, SEM, and AFM.
Other
Table: Expertise by material type and sample geometry combinations:
Materials types
Slabs
Complex shape object
Bulk samples or bars
Substrate
layer(s) on substrate
Sub-wave
length
samples
Thin films
Isotropic materials
optical, R,T,P,A
optical, R,T,P,A
Photonic crystals
optical, R,T,P,A
optical, R,T,P,A
Quasicrystals
optical, R,T,P,A
optical, R,T,P,A
Mesoscopic samples
optical, R,T
optical, R,T
Bianisotropic
optical, R,T,P
optical, R,T,P
Anisotropic
inversion symmetrical
optical, R,T,P
optical, R,T,P
Active materials
Controllable materials
Diffraction gratings
Scattering media
Other
Notation used here:
Frequency range: MHz, GHz, THz or optical R - reflection coefficient amplitude or intensity; T - transmission coefficient or intensity, P - phase information; A - reflection and transmission on many angles of incidence; E - ellipsometry data; D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization); S - internal structure investigation with microscopy (nanoscopy); Ch - chemical properties investigation (metal or dielectric etc.); Chi(2)/Chi(3) of the material