TUI Print E-mail

1. Laboratory:  TUI

Technical University of Ilmenau
Faculty of Mathematics and Science
Institut of Physics
Experimental Physics II

PO.Box: 100565
98684 Ilmenau

2. Contact point:

Name: Thomas Klar

Position: Pof.

Email: thomas.klar"you know what"

Tel.: +49 +3677 69 3670
Fax: +49 +3677 69 3770

3. Access rules:

No promotion outside the scientific community.

Facilities availability for external users:

Yes, in principle, but no promotion outside the scientific community  

Expenses reimbursement type:

Scientific collaborations, but no promotion outside the scientific community.

Rules on cooperation:

To be defined in each special case, but no promotion outside the scientific community.


 4. Equipment


4S1. - Dark filed scattering spectroscopy in the visible range can be combined with Raman / fluorescence spectroscopy          


6. Expertise


- Dark field scattering spectroscopy of metallic nanostructures, single nanoparticle spectroscopy, spectroscopy of hybrid nanomaterials comprising metallic nanostructures, organic fluorescent molecules, colloidal quantum dots etc.

- Combined Mie scattering spectroscopy and fluorescence  / Raman spectroscopy.

- All techniques in the visible range.


- Fluorescence microscopy beyond the Abbe limit (STED: Stimulated emission depletion) Microscopy. Yields some 10 nm of 3D resolution but needs fluorescing species.

Table: Expertise by material type and sample geometry combinations:

Materials types
Complex shape object Bulk samples or bars
Substrate layer(s) on substrate



Thin films

Isotropic materials
Photonic crystals              
Mesoscopic samples              
inversion symmetrical
Active materials            optical range,
combined Mie scattering, Raman and/or fluorescence

Controllable materials              
Diffraction gratings              
Scattering media              
Single nanoparticle / nanodevice          

optical range

R, T, P

Notation used here:

Frequency range: MHz, GHz, THz or optical
R - reflection coefficient amplitude or intensity;
T - transmission coefficient  or intensity,
P - phase information;
A - reflection and transmission on many angles of incidence;
E - ellipsometry data;
D - ray velocity direction or distortion (do not mix, please, with isotropic refraction index characterization);
S - internal structure investigation with microscopy (nanoscopy);
Ch - chemical properties investigation (metal or dielectric etc.);
Chi(2)/Chi(3) of the material